Sort by
Refine Your Search
-
, atomic force microscopy, high-throughput methods, in addition to a range of more traditional techniques to measure the mechanical properties and adhesion. Research projects in the group have focused
-
[email protected] 301 975 2093 Description This opportunity focuses on developing new methods, metrics, approaches, and techniques for the forensic analysis of seized drugs. Seized drug analysis is the most
-
factor” that relates the AFM deflection amplitude to surface displacement were demonstrated (Ref. 1). Isomorphic CR-PFM, a new imaging technique in which the CR frequency is held constant for all pixels
-
key component at this stage will be the development of quantum characterization protocols for spin qubits in the presence of time-correlated noise, as well as reliable tools for simulating the quantum
-
materials. Appropriate projects could include methods to reliably print electronic materials while preserving their attractive electronic properties, developing robust manufacturing methods and
-
retardant technologies More information about the fire research group https://www.nist.gov/el/fire-research-division-73300/flammability-reduction-73304 The main projects in the group are: Exposure
-
properties with three-body tight-binding model for the periodic table" https://journals.aps.org/prmaterials/abstract/10.1103/PhysRevMaterials.7.044603 2) "Magnon-phonon hybridization in 2D antiferromagnet
-
or multi-component gases. FACT will serve the sorbent materials research community by providing impartial testing and characterization of material sorption properties, establishing testing procedures, and
-
on typically used metal substrates. We are investigating various experimental approaches to form organic monolayers on semiconductor surfaces. The resulting films are characterized by using Fourier-transform
-
. A key component of the project is high sensitivity magnetic scanning microscopy of these nano-objects, most likely using SQUID magnetometers. We are seeking a postdoc with background in scanning