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of previous employment or in a legal process. Similarly, your ongoing employment is conditional upon the satisfactory maintenance of all relevant clearances and background check requirements. If you do not meet
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. Experience applying computer vision, image analysis, and/or machine-learning methods to microscopy or materials characterization data. Demonstrated ability to analyze microstructural data and relate
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transmission electron microscopy (TEM/STEM) and/or advanced image-processing techniques; proficiency in programming and in the application and development of software and computational tools for scientific data
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time-of-flight secondary ion mass spectrometry (ToF-SIMS), scanning electron microscopy (SEM), and X-ray diffraction (XRD). Experience in data reduction of big spectroscopy, mass spectrometry, and image
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material imaging (optical microscopy, SEM, EDS). English language proficiency at a minimum level of B2 or equivalent, creative approach to problem-solving, ability to work in international teams