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MEMS and NEMS; Scanning probe microscopy; Nanomanipulation; Cavity optomechanics; Optical tweezers; Plasmonic resonators; Atomic force microscopy; Nearfield scanning optical microscopy; Nanotechnology
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combines atomic force microscopy (AFM) with IR spectroscopy thus enabling IR analysis with a spatial resolution 5-10 nm (i.e. well below the diffraction limit of IR light). This enables determining chemical
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experience with a range of advanced characterisation and experimental approaches, including Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM), Confocal Laser Scanning Microscopy (CLSM
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advanced characterisation and experimental approaches, including Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM), Confocal Laser Scanning Microscopy (CLSM), phase-enhanced synchrotron X