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experience with a range of advanced characterisation and experimental approaches, including Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM), Confocal Laser Scanning Microscopy (CLSM
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advanced characterisation and experimental approaches, including Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM), Confocal Laser Scanning Microscopy (CLSM), phase-enhanced synchrotron X
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