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for high-aspect-ratio vertical interconnects characterise the results (SEM, AFM, XCT, optical microscopy) for geometric accuracy, durability and interfacial strength -validate scalability and
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interconnects characterise the results (SEM, AFM, XCT, optical microscopy) for geometric accuracy, durability and interfacial strength -validate scalability and sustainability: less material waste, better energy
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electronic transport directly with structural and nanoscale characterization, including TEM, AFM and nanoARPES. The project combines hands-on device fabrication with advanced measurements and close
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(PIMS), from the synthesis of reactive polymer to the morphological characterisation by microscopy and scattering methods (AFM, SEM, SAXS); with the essential task of implementing the formulated resins
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sustainable technologies. For more details, please view: https://www.ntu.edu.sg/eee The LUMINOUS! Centre of Excellence for Semiconductor Lighting and Displays at NTU is seeking a Research Assistant
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Website https://sede.udc.gal/services/electronic_board/EXP2026/008881 Requirements Research FieldPhysicsEducation LevelPhD or equivalent Skills/Qualifications PhD Additional Information Eligibility criteria
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operando monitoring of solid/solution interfaces. This will be done using advanced characterization techniques such as environmental scanning electron microscopy (ESEM), atomic force microscopy (AFM), Raman
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optical and spectroscopic characterization techniques such as AFM, SEM and TEM as well as XPS to characterize the deposited metallic thin film in depth. Investigating the developed electrodeposition
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, AFM, XRD, eCV, Hall, Nomarski, low- and room-temperature PL). Successful applicants will gain expertise in compound semiconductor epitaxy, advanced characterisation and will combine this with