-
14 May 2024 Job Information Organisation/Company ARCNL Research Field Physics Researcher Profile Recognised Researcher (R2) Country Netherlands Application Deadline 31 Aug 2024 - 21:59 (UTC) Type
-
14 May 2024 Job Information Organisation/Company ARCNL Research Field Physics Researcher Profile Recognised Researcher (R2) Country Netherlands Application Deadline 30 Jun 2024 - 21:59 (UTC) Type
-
media. The new approach will enable imaging and accurate characterization of nanostructures for the semiconductor industry. Optical metrology is a key ingredient of nanolithography, as it enables
-
The goal of the project is todevelop new machine learning frameworks for high-resolution optical imaging and metrology. You will use the new methods to image complex wafer metrology targets and to
-
Plasma catalysis is a fascinating research field with the potential to efficiently use electrical energy for catalytic reactions. In plasma catalysis, the reactants are activated in a plasma