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Institut Lumière Matière ILM- UMR 5306 CNRS / Université Claude Bernard Lyon 1 | Lyon, Rhone Alpes | France | 3 months ago
X-ray diffraction to HRSTEM using the St Etienne Jeol NeoARM microscope. Phase transition behavior will be monitored in-situ using Raman spectroscopy and XPS in collaboration with Debora Pierrucci
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at metal-oxide interfaces using nanosecond laser pulses and stroboscopic imaging and diffraction method to directly measure transient lattice distortions and phonon excitations. 2. Capture intermediate
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spectrometers and X-Ray Diffraction apparatus). Our laboratories are equipped with individual fume hoods allowing the secure handling of various reagents and gases, heating devices and vacuum glassware, and are
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employed. Conventional methods for characterizing emulsion properties include laser diffraction spectroscopy (LDS), optical microscopy, and dynamic light scattering (DLS). Although widely used
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treatment response. Current techniques overcome the diffraction limit (~200 nm) and enable the visualization of structures at the nanometre scale (0.1–100 nm). The pioneering work of E. Betzig, S. Hell, and W