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. We seek an outstanding postdoctoral researcher to develop next-generation MEMS probes and instrumentation for cryogenic scanning probe microscopy (SPM) and quantum measurements. The position is part
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MEMS and NEMS; Scanning probe microscopy; Nanomanipulation; Cavity optomechanics; Optical tweezers; Plasmonic resonators; Atomic force microscopy; Nearfield scanning optical microscopy; Nanotechnology
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, nanofabrication, optical spectroscopy, scanning probe microscopy, magnetometry, and optically-detected magnetic resonance. Develop experimental protocols and assist with the setup, operation, maintenance, and
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low-temperature scanning probe microscopy (SPM) to experimentally investigate the nature and properties of correlated electrons in van der Waals (vdW) systems, focusing on topological states in
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following: Scanning probe microscopy, transport measurements, superconductivity Programming experience, for scripting and data analysis Very good command of written and spoken English with extensive
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nanoscale characterization and instrumentation, and the ability to work both independently and within a collaborative, interdisciplinary research environment Ideally, prior experience with scanning probe
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-based and controlled-atmosphere methods Following changes in composition, structure, and functional properties using X-ray diffraction, Raman spectroscopy, scanning-probe microscopy, magnetometry
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particularly encouraged to apply. Experience in one or more of the following areas is desirable: microwave engineering, confocal microscopy, scanning probe microscopy, magnetic resonance spectroscopy, and
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University of British Columbia | Northern British Columbia (Fort Nelson), British Columbia | Canada | 10 days ago
the QMEMC, such as physics, chemistry, materials science, mechanical engineering, or applied physics, completed postdoctoral experience in the field of scanning transmission electron microscopy and
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metastable phases with desired structural, electronic, and magnetic functionality. Thin-film structural and functional characterization using X-ray diffraction, scanning-probe microscopy, magnetometry