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Massachusetts Institute of Technology | Cambridge, Massachusetts | United States | about 2 months ago
observations of galaxy clusters, with a focus on XRISM data to measure the line-of-sight ICM velocity structure; •Characterization of X-ray imaging detectors and supporting electronics, including testbed design
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solid booster formulations with PFAS-free binders, in line with the sustainability goals of the project. You will explore compositions and pellet morphologies to optimize mass transport and reactivity
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well as their integration into the existing process flow. Using an innovative direct etch approach, the postdoc will study the impact of the process step on the superconducting properties. The influence of line dimensions on
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beamline at Elettra, dedicated to X-ray absorption spectroscopy in the hard X-ray range, was installed on a bending magnet source and covered the 2.4 – 27.0 keV energy range, thus allowing the study of a
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formulations with PFAS-free binders, in line with the sustainability goals of the project. You will explore compositions and pellet morphologies to optimize mass transport and reactivity with the mediator
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to interact. Using these compounds, we aim to describe the covalent interactions between f-block elements, including interactions between f orbitals of Phi symmetry, leading to the emergence of a Phi-type metal
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); Characterization the nanostructures using small-angle X-ray scattering (SAXS) and dynamic light scattering (DLS); Analysis and interpretation of experimental results, along with the preparation of scientific
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beam-conditioning concepts, including grazing-incidence mirrors, multilayers, monochromators, slits, and adaptive focusing optics Perform ray-tracing and numerical simulations of beam transport
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(both X-ray and neutrons). Other characterization studies will be implemented as appropriate for the materials including photoelectron spectroscopy and impedance spectroscopy. Applicants will be expected
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methods and experimental characterization techniques. The proposed research position will bridge the expertise of Prof. Maria Diaz Lopez’s group, specializing in X-ray diffraction and related analyses