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than 18,500 people, including over 14,000 students and 4,000 researchers from more than 120 different countries. Postdoctoral Researcher in Data-driven X-ray Nanoimaging for Semiconductor Metrology Mission
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structure to detect nanoscale sample changes from the smallest possible number of X-ray measurements. Our pipeline reconstructs each projection from thousands of diffraction patterns, followed by volume
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structure to detect nanoscale sample changes from the smallest possible number of X-ray measurements. Our pipeline reconstructs each projection from thousands of diffraction patterns, followed by volume
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analysis) advanced X-ray scattering: Total scattering, Pair Distribution Function (PDF), and Bragg Coherent Diffraction Imaging (at Institut Néel and ESRF) - (Identical-Location) Transmission Electron
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Physics, Chemistry, Material Science, Geosciences or Engineering. Demonstrated experience with synchrotron x-ray techniques such as Bragg Coherent Diffraction Imaging (BCDI), X-ray Photon Correlation
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and melt-liquid structure. With the recent APS-Upgrade project completed and new high coherence and brightness x-ray beam, HPCAT has concurrently made over $20M HPCAT investments in upgrading key
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The Surface Scattering and Microdiffraction (SSM) group in the X-ray Science Division (XSD) at the Advanced Photon Source (APS), Argonne National Laboratory is seeking Two Postdoctoral Appointees