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facilities, who are developing complementary microscopy and AI/ML workflows, ensuring that multimodal datasets (X-ray, electron microscopy, and spectroscopy) are well-aligned and interoperable. These positions
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thin-film growth and characterization (oxides preferred), using sputtering (preferred), PLD, or MBE. Familiarity with synchrotron-based X-ray techniques and electron microscopy Knowledge of quantum
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