Sort by
Refine Your Search
-
. Required Knowledge, Skills, and Abilities: You are qualified for this Research Associate position if: • You earned a PhD in Chemistry, Chemical Engineering, Environmental Engineering, Material Science
-
meetings. Required Knowledge, Skills, and Abilities: PhD degree in physics, physical chemistry, chemical engineering, or closely related fields. Strong background and research experience (including graduate
-
, Physics, or a related engineering discipline) within the past five years or will have completed all PhD requirements by the commencement of employment. You have experience with ab initio or molecular
-
microelectronic structures using ptychographic imaging techniques being developed at NSLS-II. The x-ray metrology pipeline will be utilized for characterization of microelectronic structures being developed at IO
-
the big data streams from the ultra-fast direct electron detector installed on the environmental TEM. You will develop software(s) to track structural evolutions and to identify key transformations
-
, and Abilities: • A PhD. in materials science, chemistry, chemical engineering, mechanical engineering, physics, or related field. • Research experience in phase change materials (PCMs), thermochemical
-
conductance microscopy (SICM) and scanning electrochemical microscopy (SECM). You will integrate a workflow of methods to determine electrocatalyst's structure-function correlations, including: i) spatially
-
postdoctoral researcher to work on the synthesis of DNA-scaffolded structures and their incorporation into functional surfaces for bio-templated sensing and electronic devices. In this role, you will build
-
techniques including VPI and SIS. You will develop VPI/SIS parameters and protocols as required for targeted new hybrid photoresist compositions. You will investigate the chemical and structural
-
lithographic structures and deploy this understanding to yield new x-ray techniques. You will research and develop frontier analysis methods, such as machine-learning approaches, for advanced integration of x