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Requisition Id 16296 Overview: We are seeking a Postdoctoral Research Associate to develop AI-driven automation workflows for aberration-correction scanning transmission electron microscopy (STEM
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time-of-flight secondary ion mass spectrometry (ToF-SIMS), scanning electron microscopy (SEM), and X-ray diffraction (XRD). Experience in data reduction of big spectroscopy, mass spectrometry, and image
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Requisition Id 16869 Overview: We are seeking a Postdoctoral Research Associate to use advanced scanning probe microscopy for the development and application of multiscale excitonic probes. In
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and aspects related to safety and best practices. The candidate will make extensive use of state-of-the-art imaging, spectroscopy (Raman, electron microscopy, infrared, etc.) and scattering methods
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, DMA, TMA, XRD, rheology, twin-screw extruders, and electron and optical microscopy Design and execute experiments to characterize experiments to characterize new, innovative materials for a variety of
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characterization techniques such as DSC, FTIR, TGA, DMA, EDS, XRD, Rheology, SEM, and optical microscopy. An excellent record of productive and creative research as demonstrated by publications in peer-reviewed
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, magnetic, and superconducting properties Work with other atomic characterization expertise for scanning tunneling microscopy and quantum device development Publish scientific papers in key journals and
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for characterization and analysis of membranes and composites including X-ray/neutron powder diffraction, electron microscopy and lithium analysis using ICP, NMR, etc. Collaborate with ORNL postdocs and staff who
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an emphasis on material science or characterization completed within the last five years Strong background in materials characterization techniques, such as microscopy, XRD, EBSD, and X-ray CT Interest in