Sort by
Refine Your Search
-
Requisition Id 16296 Overview: We are seeking a Postdoctoral Research Associate to develop AI-driven automation workflows for aberration-correction scanning transmission electron microscopy (STEM
-
time-of-flight secondary ion mass spectrometry (ToF-SIMS), scanning electron microscopy (SEM), and X-ray diffraction (XRD). Experience in data reduction of big spectroscopy, mass spectrometry, and image
-
with complementary techniques such as Kelvin probe force microscopy, scanning microwave impedance microscopy, cathodoluminescence, Raman spectroscopy, and electron microscopy to connect local chemical
-
and aspects related to safety and best practices. The candidate will make extensive use of state-of-the-art imaging, spectroscopy (Raman, electron microscopy, infrared, etc.) and scattering methods
-
, DMA, TMA, XRD, rheology, twin-screw extruders, and electron and optical microscopy Design and execute experiments to characterize experiments to characterize new, innovative materials for a variety of
-
characterization techniques such as DSC, FTIR, TGA, DMA, EDS, XRD, Rheology, SEM, and optical microscopy. An excellent record of productive and creative research as demonstrated by publications in peer-reviewed
-
Qualifications: Extensive experience with twisted materials fabrication and characterization. Knowledge of correlated-electron physics. Experience with spin-polarized scanning tunneling microscopy and quantum
-
for characterization and analysis of membranes and composites including X-ray/neutron powder diffraction, electron microscopy and lithium analysis using ICP, NMR, etc. Collaborate with ORNL postdocs and staff who