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STFP Home sign in | focus RAP opportunity at National Institute of Standards and Technology NIST Advanced Nanoscale Property Characterization by Atomic Force Microscopy Location Material
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is high sensitivity magnetic scanning microscopy of these nano-objects, most likely using SQUID magnetometers. We are seeking a postdoc with background in scanning microscopy or magnetic instrument
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sample preparation, manipulation, and electrical probing in conjunction with electron microscopy (SEM). Such probes not only have proven research utility, but are also used in industrial development and
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301.975.2958 Description As of today, there is a plethora of cyber-physical instruments consisting of physical sensing (e.g., microscopy imaging) and cyber (digital) Artificial Intelligence (AI)-based
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hyperspectral data. (2) A new microscopy platform with 100-fold improvement in speed and detection limit over even this newest instrument. These efforts will facilitate high throughput imaging to
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combines atomic force microscopy (AFM) with IR spectroscopy thus enabling IR analysis with a spatial resolution 5-10 nm (i.e. well below the diffraction limit of IR light). This enables determining chemical
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and adhesion including nanoindentation, atomic force microscopy, high-throughput methods, in addition to a range of more traditional techniques to measure the mechanical properties and adhesion
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design approaches to extending their utility. We use Small-Angle Neutron Scattering (SANS) in combination with a variety of other techniques such as light scattering and polarized microscopy to
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). Keywords Bio-interfaces; Biomolecules; Biosensors; Chemical sensors; Nanomaterials; Nanosensors; Optical methods; Photoemission spectroscopy; Scanning probe microscopy; Surfaces; Transduction; Eligibility