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time-of-flight secondary ion mass spectrometry (ToF-SIMS), scanning electron microscopy (SEM), and X-ray diffraction (XRD). Experience in data reduction of big spectroscopy, mass spectrometry, and image
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Requisition Id 16869 Overview: We are seeking a Postdoctoral Research Associate to use advanced scanning probe microscopy for the development and application of multiscale excitonic probes. In
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and aspects related to safety and best practices. The candidate will make extensive use of state-of-the-art imaging, spectroscopy (Raman, electron microscopy, infrared, etc.) and scattering methods
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. Basic Qualifications: PhD in Chemistry, Materials Science & Engineering, Chemical Engineering, Polymer Science and Engineering, or a related discipline completed within the last five years and have a
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Requisition Id 16296 Overview: We are seeking a Postdoctoral Research Associate to develop AI-driven automation workflows for aberration-correction scanning transmission electron microscopy (STEM