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modelling, high-speed device engineering, fabrication-aware optimisation and experimental validation. The final level and scope of the role will be determined based on the successful candidate's background
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electron microscopy inspections. These inspections play a crucial role throughout the technology development cycle, providing wafer-level characterization of processes and materials used in both More-than
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characterisation methods available within the MCA department and imec’s advanced fab environment, building a deeper understanding of how materials and interfaces influence device performance. You will also follow
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