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Universitat Politècnica de Catalunya (UPC)- BarcelonaTECH | Barcelona, Cataluna | Spain | 28 days ago
Barcelona School of Informatics (<b>FIB</b>) Country Spain State/Province Barcelona City Barcelona Postal Code 08034 Street Jordi Girona, 1-3 Geofield Contact State/Province Barcelona City Barcelona Website <b>https</b>://www.upc.edu/ Street C. Jordi Girona, 31 Postal Code 08034 E-Mail...
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techniques SEM, FIB & TEM AFM and other surface probe techniques Nano fabrication XRD and XPS Willingness to learn new skills Deep understanding of the properties of materials and their underlying
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energy-efficient and sustainable technologies. For more details, please view: https://www.ntu.edu.sg/eee The LUMINOUS! Centre of Excellence for Semiconductor Lighting and Displays at NTU is seeking a
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under reference CJU-010000-2025-0005, as part of the Recovery, Transformation and Resilience Plan (PRTR). Where to apply Website https://jobs.icfo.eu/?detail=1152 Requirements Research Field Chemistry
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therapeutic targets. The IND cryo-EM facility is state of the art and includes a Titan Krios G4, Glacios, and L120C TEM instruments, as well as a Helios Hydra plasma FIB-SEM. The IND is directed by Nobel
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characterization methods, including SEM/EDS, EBSD, FIB-SEM, XRD, or TEM. Experience handling actinide, radioactive, air-sensitive, or other controlled materials. Pay Range $123,048 Annually This is
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energy spectrometers. Experience with designing, modifying, building, and automating vacuum systems. Experience with focused ion beam technology (FIB). Pay Range $123,048 Annually This is the lowest to
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Delft University of Technology (TU Delft) | Delft, Provincie Zuid-Holland | Netherlands | 6 days ago
, from semiconductor inspection and metrology, to cryogenic electron microscopy for biological samples. The cluster has access to state-of-the-art field-emission SEMs and FIB-SEMS, with a new microscope
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), photon emission microscopy (PEM), and focused ion beam (FIB) imaging - can be combined with AI to reconstruct nanoscale chip structures and infer functional behaviour from physical layouts. The
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Delft University of Technology (TU Delft) | Delft, Provincie Zuid-Holland | Netherlands | 6 days ago
, from semiconductor inspection and metrology, to cryogenic electron microscopy for biological samples. The cluster has access to state-of-the-art field-emission SEMs and FIB-SEMS, with a new