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. Investigating the etching mechanisms and selectivity of InP and InGaAlAs films as a function of plasma parameters using ellipsometry, XPS and AFM. 2. Developing an etching process for the multilayer stack meeting
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, ellipsometry, and related techniques. Prepare and characterize chiral molecular assemblies and substrates, including DNA-based and other biomolecular chiral systems where relevant. Author peer-reviewed
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-film optics, micro/nano optics, or 2D materials. Familiarity with optical simulation software (FDTD, COMSOL, MATLAB etc.) and experimental characterization tools (ellipsometry, Raman, AFM, SEM, EBL etc
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, AFM, ellipsometry, or TEM will be considered an asset. The successful candidate should also demonstrate: - strong experimental skills; - the ability to independently design and conduct experiments
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metrology, ellipsometry, or related surface-analysis methods. You are interested in connecting experimental results to physical models and quantitative data analysis. You enjoy hands-on experimental work and
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National Aeronautics and Space Administration (NASA) | Pasadena, California | United States | 19 days ago
candidate with strong cleanroom fabrication tool experience, particularly in materials characterization methods such as ellipsometry, AFM, SEM, TEM, XRD, SIMS, or related techniques. Experience with
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, ALD, e-beam evaporation, lift-off, annealing). Experience with optical/electrical device characterization and metrology (SEM, AFM, ellipsometry/ reflectometry, profilometry) and yield/ failure analysis
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fluorescence, FTIR, Raman and UV/VIS spectroscopies, AFM, and spectroscopic ellipsometry. Biophotonics; Photonics; Biophysics; Molecular structure at interfaces; Nonlinear optics; Multiphoton Spectroscopy; Sum
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support metrology tools (e.g., ellipsometry, profilometry, SEM, AFM, XRR) to characterize film thickness, uniformity, stress, adhesion, and morphology. Correlate metrology data with equipment performance
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properties of the coatings using ellipsometry. You characterize the interfacial properties (surface passivation) using QSSPC (quasi-steady-state photoconductance decay) and PL (photoluminescence). You measure