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STFP Home sign in | focus RAP opportunity at National Institute of Standards and Technology NIST First-Principle Based Modeling for Advancing 2D Electronics Location Material Measurement
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Joel N. Ullom [email protected] 303.497.4408 Description For many measurement applications, the sensitivity of cryogenic instrumentation far surpasses that of conventional room temperature electronics
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to thermoelectrics for energy harvesting, and tunable materials such as ferroelectrics and multiferroics for adaptable electronics. New materials are continually being developed for electronic
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