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FACTS is NTU's central shared facility specialising in characterisation using electron microscopy and X-ray techniques. FACTS invites applications for the position of Research Fellow / Senior
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as TEM, AFM, SEM, and X-ray diffraction on single crystals, polycrystals, pure metals, and alloys. Keywords Atomic force microscopy; Dislocations; Scanning electron microscopy; Transmission
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samples suitable for electron, X-ray and neutron studies. Perform preliminary characterization using scanning electron microscopy, powder X-ray diffraction and elemental analysis. Diffraction data
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National Synchrotron Light Source (NSLS). Keywords Additive manufacturing; Electron microscopy; X-ray diffraction; X-ray computed tomography; Mechanical properties; Fatigue; Fracture; Modeling; Atom probe
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-property relationships using electron microscopies and x-ray and neutron diffraction and theoretical work on modeling constitutive behavior. Numerous opportunities exist to interact with industrial
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-resolved hard X-ray diffraction microscopy and spectroscopy on single-crystalline bulk and thin film quantum materials (e.g. ferroelectrics, multiferroics, strongly correlated electron systems). This
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performed on the Hard X-ray Diffraction Microscopy (ID03) beamline at the ESRF. Building on the existing DCT code base developed for near-field acquisitions without X-ray optical magnification, you will
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, combining laboratory-based and synchrotron techniques, including X-ray-based techniques and electron microscopy. The final part of the thesis will focus on evaluating the photocatalytic performance of the
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possess translational symmetry, the role of structure and symmetry in glasses is not established. This research programme involves the development of new x-ray and electron diffraction-based methods
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; 5. Structural, chemical, and morphological characterization (X-ray diffraction – DRX, scanning electron microscopy – SEM, transmission electron microscopy – TEM, Raman spectroscopy, Fourier transform