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Field
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Knowledge: Experience with advanced microscopy techniques such as transmission electron microscopy (TEM), scanning electron microscopy (SEM), electron backscatter diffraction (EBSD), and nano/microindentation
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Application Experience of template-mediated synthesis Desirable Application/interview Practical experience of standard materials characterisation techniques including X-ray diffraction, scanning electron
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including X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), Raman spectroscopy, Fourier-transform infrared spectroscopy (FTIR), mechanical testing
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microscopy (SEM), electron backscatter diffraction (EBSD), and nano/microindentation. Preferred Qualifications: Experience with in-situ mechanical property characterization is preferred. Background
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characterize inorganic compounds or materials using techniques such as X-ray diffraction, NMR spectroscopy, and electron microscopy. Analyse experimental data, interpret results, and contribute
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of spoken and written English ADDITIONAL SKILLS Experience on advanced electron microscopy, including techniques such advanced electron diffraction, mono-EELS, automated / programmable EM data acquisition
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facilities (X-ray diffraction, electron microscopy, chemical analysis, etc.) as well as dedicated investments in spectroscopy and crystal-growth equipment. The strengthening of the human resources devoted
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are searching for a motivated Materials Research and Development Engineer to join our Electronic Materials and Devices Department (EMDD) at the Applied Research Laboratory (ARL) at Penn State. This role will
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National Energy Technology Laboratory (NETL) | Pittsburgh, Pennsylvania | United States | 2 months ago
Fluorescence (XRF), X-ray Diffraction (XRD), X-Ray Photoelectron spectroscopy (XPS) and Scanning Electron Microscopy (SEM). 4. Experience in mentoring graduate students, and a proven track record of publications
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collaborate with various partners in the consortium, including partners working on catalyst synthesis, complementary surface X-ray diffraction, and complementary (in situ) electron microscopy. Secondments