74 electron-diffraction "https:" positions

  • CNRS | Strasbourg, Alsace | France | 26 days ago

    science, or a related field; • Strong knowledge of thin-film growth techniques (PLD, MBE, or similar methods); • Experience in structural characterization (X-ray diffraction, electron microscopy

  • Forschungszentrum Jülich | Ger, Midi-Pyrénées | France | 25 days ago

    beam electron diffraction, electron energy loss spectroscopy, and geometrical phase analysis Investigation of carrier generation and recombination processes and their interaction with shallow and deep

  • CNRS | Villeurbanne, Rhône-Alpes | France | about 10 hours ago

    -vacuum lines, GC–MS, IR and UV–Vis spectrometers, solution- and solid-state NMR spectrometers, electron microscopy facilities, etc.). Where to apply Website https://emploi.cnrs.fr/Offres/CDD/UMR5128-CLECAM

  • Forschungszentrum Jülich | Jülich, Nordrhein-Westfalen | Germany | 2 months ago

    PhD in Physics, Materials Science or a closely related field In-depth working knowledge of electron microscopy, including image formation and contrast mechanisms, electron diffraction, and

  • CNRS | Villetaneuse, Île-de-France | France | 6 days ago

    synthesis reactor developed as part of the project. The PhD candidate will use a range of characterization techniques, including X-ray diffraction and total X-ray scattering, scanning and transmission

  • CNRS | Grenoble, Rhône-Alpes | France | about 2 months ago

    , chromatography, electron microscopy, X-ray diffraction, etc.). Methodology: • Design and synthesize model substrates to measure the activity of enzyme mimics. • Develop analytical methods to detect and quantify

  • FAPESP - São Paulo Research Foundation | São Paulo, Sao Paulo | Brazil | 2 months ago

    ; 5. Structural, chemical, and morphological characterization (X-ray diffraction – DRX, scanning electron microscopy – SEM, transmission electron microscopy – TEM, Raman spectroscopy, Fourier transform

  • University of Arkansas | Fayetteville, Arkansas | United States | about 19 hours ago

    loss spectroscopy (EELS) and selected area electron diffraction (SAED), as well as TEM specimen preparation using focused ion beam (FIB) techniques and analysis of HR-TEM images using fast Fourier

  • Lawrence Livermore National Laboratory | Tracy, California | United States | about 2 hours ago

    diffraction, electron microscopy, spectroscopy, metallography, and quantitative image analysis. Publish research results in peer-reviewed journals and present results at conferences, seminars, and technical

  • Forschungszentrum Jülich | Jülich, Nordrhein-Westfalen | Germany | about 2 months ago

    electron beams and detectors Structural and electrical characterization using TEM techniques such as scanning transmission electron microscopy, convergent beam electron diffraction, electron energy

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