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Diffraction Facility (EMXDF): A state-of-the-art facility for micro-analytical characterization of geological and materials samples, featuring scanning electron microscopy (SEM) with EDS capabilities
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, X-ray diffraction and Transmission and Scanning Electron Microscopy (STEM). Languages: English, at C1 level or above Other: Experience as a research support technician, scientific publications or
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free electron lasers (XFEL). Optical phase change materials can be reversibly switched between amorphous and crystalline states on fast timescales and are enabling materials for emerging photonic
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overview The goal of this project is to advance the understanding of failure mechanisms in optical phase change materials used in photonic devices, using synchrotron X rays and X ray free electron lasers
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will then be possible to characterize the morphology and grain size using electron backscatter diffraction (EBSD) analysis of the sample surface prior to testing, and subsequently to determine the
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: • Extrusion and Digital Light Processing (DLP) 3D printing • 3D printing combined with electrospinning • Rheological analyses • Infrared and UV-vis spectroscopy • X-ray diffraction and Scanning Electron
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? Not funded by a EU programme Is the Job related to staff position within a Research Infrastructure? No Offer Description The PhD work will be carried out within the EMPRe team ( https://dcm.univ
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Department of Earth, Ocean and Atmospheric Sciences - University of British Columbia | Northern British Columbia (Fort Nelson), British Columbia | Canada | about 1 month ago
installed triple-quadrupole ICP-MS (ICP-MS/MS). Electron Microbeam and X-ray Diffraction Facility (EMXDF): A state-of-the-art facility for micro-analytical characterization of geological and materials
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samples, utilizing routine characterization tools such as Scanning Electron Microscopy (SEM), atomic force microscopy, X-Ray Diffraction (XRD), cathodoluminescence(CL) and micro photoluminescence (microPL
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methods; (2) Production through arc melting, powder metallurgy or additive manufacturing; (3) Characterisation using advanced electron microscopy (SEM, EBSD, TEM), APT and x-ray diffraction methods; (4