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-resolved hard X-ray diffraction microscopy and spectroscopy on single-crystalline bulk and thin film quantum materials (e.g. ferroelectrics, multiferroics, strongly correlated electron systems). This
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in-situ and ex-situ ion irradiation, corrosion and environmental testing, nano-indentation, transmission and scanning electron microscopy, electron backscatter diffraction, focused ion beam specimen
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diffraction, electron microscopy (SEM and TEM), spectroscopy (FTIR and Raman), and other materials characterization techniques. Publication record with excellent written and oral communication skills
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spectroscopy). Knowledge of thin-film and materials characterization techniques such as X-ray diffraction, X-ray photoelectron spectroscopy, atomic force microscopy, and scanning electron microscopy
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multiple DOE user facilities, who are developing complementary microscopy and AI/ML workflows, ensuring that multimodal datasets (X-ray, electron microscopy, and spectroscopy) are well-aligned and
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techniques. Experience using analytical tools, such as X-ray diffraction, electron microscopy (SEM and TEM), spectroscopy (FTIR and Raman), and electrochemical (EIS and battery cycler). Publication