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partial and total reduction processes of the films, with or without capping layers; • Performing structural and electronic characterization using X-ray diffraction and synchrotron-based experiments, in
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-metal bond. In addition to these electronic characteristics, the electronic nature of these assemblies results in marked reactivity with small molecules. In particular, we propose to study in detail
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physicochemical characterization using techniques such as: Powder X-ray diffraction (PXRD), Infrared (IR) spectroscopy, Thermogravimetric analysis (TGA), Gas adsorption measurements, Scanning electron microscopy
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, electron microscopy, X-ray diffraction, etc.). Methodology: • Design and synthesize model substrates to measure the activity of enzyme mimics. • Develop analytical methods to detect and quantify chemical
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group at C2N. - characterisation of the doping profile and structural properties of the superconducting films and devices using X-ray diffraction (XRD), transmission electron microscopy (TEM), and