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, using arc melting and rapid solidification techniques (melt-spinning); • X-ray diffraction (XRD) measurements and data analysis (phase identification, determination of lattice parameters, and evaluating
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Research Associate (Materials Science & Engineering / Mechanical Engineering / Chemical Engineering)
the industrial translation of our research outcomes. Key Responsibilities: Material Characterizations: Conduct microstructural analysis using Scanning Electron Microscopy (SEM), Electron Backscatter Diffraction
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technical expertise in X-ray characterization methods, including X-ray photoelectron spectroscopy, X-ray diffraction, small- and wide-angle X-ray scattering, and X-ray fluorescence spectroscopy. The position
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. To overcome these obstacles, it is necessary to develop and apply multi-modal optical microscopy methods, such as fluorescence based super-resolution microscopy and label-free optical diffraction tomography and
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of refractory and other high temperature alloys. Key activities include materials processing, microstructural characterization using scanning electron microscopy and electron backscatter diffraction, and
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Requisition Id 16946 Overview: We are seeking a Computational Instrument Scientist who will focus on developing software analysis tools for the powder diffraction instruments. This position
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the use of multi-technique characterisation of inorganic materials, including at least some of the following: pXRD, single-crystal XRD, SEM/EDX, DSC/TGA/STA, EXAFS, laser diffraction (PSD), ICP-OES, XRF
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Science Foundation's Programmable Cloud Laboratories (PCL) Test Bed program to establish ELECTRA, a remotely accessible, AI-enabled automated laboratory for electron diffraction (MicroED) and structural
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. About You You should demonstrate extensive experience of STEM characterisation of electron beam sensitive materials, including imaging, diffraction and spectroscopy, with experience of acquiring 4
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extensive experience with advanced TEM characterization techniques, including electron energy loss spectroscopy (EELS) and selected area electron diffraction (SAED), as well as TEM specimen preparation using