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, Department of Civil and Mechanical Engineering, Section for Manufacturing Engineering, has a vacant postdoc position within the EIC Transition project Laboratory 4 Dimensional X-ray Diffraction for Sustainable
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Requisition Id 16974 Overview: We are seeking a Postdoctoral Research Associate to conduct Mechanical Behavior of Advanced Structural Alloys by Engineering Diffraction. This position resides in
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8 Sep 2026 Job Information Organisation/Company European Synchrotron Radiation Facility Research Field Physics Researcher Profile Established Researcher (R3) Positions Postdoc Positions Application Deadline 8 Oct 2026 - 23:59 (Europe/Paris) Country France Type of Contract Temporary Job...
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time-resolved hard X-ray diffraction microscopy and spectroscopy on single-crystalline bulk and thin film quantum materials (e.g. ferroelectrics, multiferroics, strongly correlated electron systems
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synthesis and melt crystal growth Structural characterization of the synthesized materials, including by X-ray diffraction Investigation of magnetic and thermodynamic low-temperature properties using standard
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through comparative X-ray diffraction analyses. The ultimate aim is to obtain a 3D reconstruction and refine the structural model by taking into account X-ray diffraction data (SAXS-WAXS) and the literature
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treatments, and mechanical testing; characterizes microstructure using scanning electron microscopy (SEM), electron backscatter diffraction (EBSD), transmission microscopy (TEM/STEM), STEM-EELS, in-situ TEM
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surface-sensitive diffractive microscope? Excited about building novel electron-optical systems? We're looking for you! Job description We are looking for a postdoctoral researcher to join the Curious Beams
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theory, molecular dynamics, cluster expansion, and machine learning. This work will have strong links to the experimental synthesis, diffraction and electrochemical work performed in the overall project
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of refractory and other high temperature alloys. Key activities include materials processing, microstructural characterization using scanning electron microscopy and electron backscatter diffraction, and