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Field
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developed that uses a diffractive mask to imprint a highly stable optical ruler onto the telescope image, enabling the detection of minute stellar motions caused by orbiting planets. To make this measurement
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science to achieve astrometric measurements at unprecedented levels of precision. To accomplish this, a unique optical system has been developed that uses a diffractive mask to imprint a highly stable
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of novel optical methods for nanoscale dimensional measurements using the NIST 193 nm Microscope: a newly upgraded, custom-built, world-class high-magnification optical imaging platform optimized
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advanced electron microscopy analysis using techniques such as high resolution imaging, compositional mapping and EELS, as well as other techniques available on the instrument. This might also include access
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at metal-oxide interfaces using nanosecond laser pulses and stroboscopic imaging and diffraction method to directly measure transient lattice distortions and phonon excitations. 2. Capture intermediate
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material characterization using x-ray diffraction and/or spectroscopy techniques and corresponding data interpretation will be an advantage. Ability to work as a member of an international, multi
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technology research and development by fabricating prototype electrodes and pouch cells in a dry-room environment and by contributing to experimental design, data interpretation, and technical reporting
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Configure furnaces/reactors and hardware for vacuum systems Perform equipment maintenance and troubleshooting Characterize materials and devices (e.g., microscopy, spectroscopy, X-ray diffraction, electrical
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plasma dynamics in strongly excited materials. A complementary part involves coherent diffractive imaging and holographic techniques for the spatio-temporal characterization of transient laser-induced
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Physics, Chemistry, Material Science, Geosciences or Engineering. Demonstrated experience with synchrotron x-ray techniques such as Bragg Coherent Diffraction Imaging (BCDI), X-ray Photon Correlation