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Field
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microstructural characterisation using optical microscopy, scanning electron microscopy (SEM), and electron backscatter diffraction (EBSD). Assist in materials analysis, interpretation of microstructural features
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Laser Doping or Pulsed Laser Induced Epitaxy, allowing the fabrication of ultra-doped Si:B layers, well above the B solubility limit in Si. The films will be characterized by X-Ray Diffraction
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Helmholtz-Zentrum Dresden-Rossendorf - HZDR - Helmholtz Association | Tremblay en France, le de France | France | 2 months ago
/corresponding author) # Solid experience in analysisng X-ray spectroscopy and X-ray diffraction data using quantum mechanical methods # Basic understanding of the alignment of synchrotron optics and the operation
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Essential Application Experience in cold sintering Desirable Application/interview Experience of standard materials characterisation techniques including X-ray diffraction, scanning electron microscopy, FTIR
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Postdoc (f/m/d) at Rossendorf Beamline at the ESRF / Completed PhD in Physics, Chemistry, Materia...
Helmholtz Association of German Research Centres | Tremblay en France, le de France | France | about 2 months agowith synchrotron-based experiments (proven by relevant publications as a first/corresponding author) # Solid experience in analysisng X-ray spectroscopy and X-ray diffraction data using quantum
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crystallography, specifically in the structure solution and refinement of small molecule crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based
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Knowledge: Experience with advanced microscopy techniques such as transmission electron microscopy (TEM), scanning electron microscopy (SEM), electron backscatter diffraction (EBSD), and nano/microindentation
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Application Experience of template-mediated synthesis Desirable Application/interview Practical experience of standard materials characterisation techniques including X-ray diffraction, scanning electron
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including X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), Raman spectroscopy, Fourier-transform infrared spectroscopy (FTIR), mechanical testing
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microscopy (SEM), electron backscatter diffraction (EBSD), and nano/microindentation. Preferred Qualifications: Experience with in-situ mechanical property characterization is preferred. Background