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Field
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crystallography, specifically in the structure solution and refinement of small molecule crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based
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. The postdoc will analyze the phase and composition of their reaction products using techniques spanning X-ray diffraction, energy dispersive X-ray spectroscopy, electron microscopy, and calorimetry. The postdoc
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. The postdoctoral fellow must be familiar with the standard characterization techniques used in the group (X-ray diffraction, magnetism, EPR, NMR, UV-Vis-NIR, and infrared/Raman spectroscopy). In order to design
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significant experience and expertise in air-free synthetic methods (e.g., Schlenk and glovebox techniques), crystal growth and analysis using single-crystal X-ray diffraction, and spectroscopic characterization
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measurements. Our pipeline reconstructs each projection from thousands of diffraction patterns, followed by volume reconstruction from projections measured at many rotation angles. These are two inverse problems
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functional theory (DFT) calculations of NMR parameters, powder X-ray diffraction, and other complementary analytical techniques. The postdoctoral researcher will be responsible for planning and conducting
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using X-ray and neutron diffraction Investigation of ionic transport by impedance spectroscopy and complementary electrochemical methods Determination of electronic, vibrational and vibronic structure
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diffraction data, with particular focus on soft materials. Experience in thin-film fabrication and/or additional characterisation techniques such as EDX/EELS and GIWAXS/GISAXS is desirable. Previous experience
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, electron microscopy, X-ray diffraction, etc.). Methodology: • Design and synthesize model substrates to measure the activity of enzyme mimics. • Develop analytical methods to detect and quantify chemical
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methods and experimental characterization techniques. The proposed research position will bridge the expertise of Prof. Maria Diaz Lopez’s group, specializing in X-ray diffraction and related analyses