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Infrastructure? No Offer Description Area of research: PHD Thesis Job description:PhD Position - 3D electron diffraction of magnetism and structural disorder in NiO The Ernst Ruska-Centre for Microscopy and
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. Bert Koopmans, based at Eindhoven University of Technology. PhD candidate 1 will explore fundamental processes underlying the deterministic creation and annihilation of sub-diffraction limited skyrmions
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laboratories: the Institut de Chimie Moléculaire-ICMG for NMR spectroscopy, mass spectrometry (MS), X-ray diffraction, and EPR. The development of artificial photosynthesis systems for water splitting and CO
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crucial information on material quality, structure, and chemistry, in particular when coupled with X-ray diffraction studies and low-temperature transport properties. Importantly, in situ TEM measurement
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or biofabrication. You have demonstrated research and experimental skills, for example through your Master’s thesis. Experience with one or more of the following is an asset: X-ray diffraction, thermal analysis
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diagnostic methodology for metallic lithium plating in industry-relevant cell formats. The approach is fundamentally based on diffraction and small-angle scattering techniques using both X-rays and neutrons
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chiral magnon behavior and push the experimental frontier of altermagnetic research. Your tasks include: Preparation of samples for neutron diffraction experiments Characterization using in-house PPMS
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metallurgy or additive manufacturing; characterisation using advanced electron microscopy and x-ray diffraction techniques; mechanical testing using macro/micro-mechanical methods and failure investigation
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complementary spectroscopy, diffraction, microscopy and chemical/impurity analysis. The project will explore how Magnox and AGR graphites differ from modern candidate graphite grades, how treatment or recycling
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, structure, defect chemistry, and ionic transport behaviour. Comprehensive materials characterisation will be undertaken using structural, thermal, and electrochemical techniques, including X-ray diffraction