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Field
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, is a materials science beamline specialising in X-ray diffraction and full-field imaging techniques. The beamline serves a very wide user community, spanning physics and chemistry to medical science. A
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), knowledge of MOF material research techniques, including at least powder X-ray diffraction (PXRD), spectroscopic techniques (FT-IR, NMR, UV-vis), sorption techniques (particularly gas physisorption), and
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crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based on powder diffraction, neutron diffraction, or scattering data will also be
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, multilayers, diffraction optics, beam transport, and focusing optics Experience with ray-tracing and optical simulation tools (e.g. SHADOW, OASYS, XOP, SRW, COMSOL, Zemax, or comparable software) Experience
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solubility behavior, nucleation kinetics, and polymorph screening Experience with characterization techniques such as UV/Vis spectroscopy and X-ray diffraction (XRD) Experience working with automated or high
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National Energy Technology Laboratory (NETL) | Pittsburgh, Pennsylvania | United States | about 2 months ago
Fluorescence (XRF), X-ray Diffraction (XRD), X-Ray Photoelectron spectroscopy (XPS) and Scanning Electron Microscopy (SEM). 4. Experience in mentoring graduate students, and a proven track record of publications
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Diffraction facilities. For more information about the Michaudel lab, please visit the group's website . Opportunities to Contribute Conducting research in Organic/Polymer Chemistry. Participate in analyzing
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analysis and interpretation of multidimensional microscopy datasets, integrating image processing, spectroscopy, diffraction, and computational methods to extract meaningful scientific insights. 3) Lead the
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diffraction, electron microscopy (SEM and TEM), spectroscopy (FTIR and Raman), and electrochemical (EIS and battery cycler). Publication record with excellent written and oral communication skills. Ability
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spectroscopy (EIS) and cyclic voltammetry Familiarity with synchrotron-based X-ray characterization techniques, including diffraction and spectroscopy, particularly for in situ studies of materials and