27 chromosome-structure-imaging Postdoctoral positions at Oak Ridge National Laboratory
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Requisition Id 16974 Overview: We are seeking a Postdoctoral Research Associate to conduct Mechanical Behavior of Advanced Structural Alloys by Engineering Diffraction. This position resides in
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Requisition Id 16386 Overview: We are seeking a Postdoctoral Research Associate to conduct advanced research on the mechanical behavior and microstructure evolution of advanced structural alloys
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research. Your work will focus on developing selective chelation strategies and applying these systems to targeted radionuclide therapy and cancer imaging. Research accomplishments will be disseminated
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pipelines for structured and unstructured data Experience with multimodal datasets (e.g., imaging, time-series, and process data) Experience with API-based data services, workflow automation, or integration
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capabilities in evaluating physical and chemical properties of environmental samples including plants and soil. Experience integrating phenotypic or imaging-based datasets (e.g., RGB, chlorophyll fluorescence
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represents expertise in nuclear materials synthesis and analysis, deployment of advanced analytical methods including crystallography, imaging, spectroscopy, physical property analysis, neutron scattering, and
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Postdoctoral Research Associate - Multifunctional Equipment Integration Energy Conversion Technology
research assignments related to energy conversion systems including: Prototype development Material synthesis and analysis Performance testing Analysis of results Preparing research publications Prepare
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for building envelopes of new construction and retrofits to enable DOE’s energy efficiency goals. Our synergistic research areas include building science, material and system development, and advanced
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and aspects related to safety and best practices. The candidate will make extensive use of state-of-the-art imaging, spectroscopy (Raman, electron microscopy, infrared, etc.) and scattering methods
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time-of-flight secondary ion mass spectrometry (ToF-SIMS), scanning electron microscopy (SEM), and X-ray diffraction (XRD). Experience in data reduction of big spectroscopy, mass spectrometry, and image