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-situ and in-operando investigations of the materials, thin films, and interfaces crucial to energy related systems. NR is a non-perturbing probe of the depth profile of structure in thin-film materials
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301.975.6050 Jan Obrzut [email protected] 301.975.6845 Description As part of a collaborative NIST-wide program involving structural characterization, modeling, and high-throughput microwave measurement, we
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interfaces and sensor material-electrode contacts; and (2) methods to reduce/eliminate drift and to provide self-calibration routines. Arrays; Bio-inspired methods; Biosensors; Chemical sensors; MEMS
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, and solid- or liquid-gas interfaces. By measuring the specular reflectivity as a function of glancing angle, we can determine both chemical and magnetic density profiles normal to the surface. We can
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operations of Josephson junctions (JJs). Active areas of interest include interfacing these two dissimilar systems with electro-optics ( i.e. superconducting microwave cavity) or strain ( i.e. surface acoustic
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relevant to (e.g.) the electrodes and electrolyte of SOFCs, component phases and interfaces in fuel-reforming, hydrogen storage or carbon dioxide capture materials. In these cases, the microstructure
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multiscale modeling via machine learning force fields. This research will focus on applying a range of computational tools to realistic material systems, including interfaces and defects. This research will
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, chirality), and the resulting dielectric and mechanical properties. Of our particular interest is quantification and control of affinity to moisture and shear transfer ability of CNC interfaces in
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., Atomic-Scale Imaging and Spectroscopy of Electroluminescence at Molecular Interfaces. Chem. Rev. 2017,117 (7), 5174-5222. AFM-IR; PTIR; STML; PiFM; Infrared spectroscopy; electroluminescence; nanoscale
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to effectively convert interactions occurring at gas-solid or liquid-solid interfaces, or between molecules, into measurable signals that provide information on the nature and concentration of chemical and