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STFP Home sign in | focus RAP opportunity at National Institute of Standards and Technology NIST Advanced Nanoscale Property Characterization by Atomic Force Microscopy Location Material
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element of a variety of nanoscale measurement and manipulation techniques, ranging from scanning probe microscopies, such as atomic force (AFM), scanning tunneling (STM), and nearfield optical (NSOM), to
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combines atomic force microscopy (AFM) with IR spectroscopy thus enabling IR analysis with a spatial resolution 5-10 nm (i.e. well below the diffraction limit of IR light). This enables determining chemical
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and adhesion including nanoindentation, atomic force microscopy, high-throughput methods, in addition to a range of more traditional techniques to measure the mechanical properties and adhesion
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transport across cell membranes, charge separation, energy converting biological processes, and signal transduction. However, despite their obvious importance, atomic structures have been determined
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lithography, magnetic sensors (e.g., GMR, MTJ, SQUIDs, atomic magnetometers), magnetic nanoparticles, and magnetic particle imaging (MPI). References: Bui TQ, Biacchi AJ, Dennis CL, Tew WL, Hight Walker