-
the design and experimental characterization of micro- or nanoscale devices Experience in at least one of the following areas: scanning probe microscopy (AFM/STM), piezoelectric/resistive MEMS, low-noise
-
variety of nanoscale measurement and manipulation techniques, ranging from scanning probe microscopies, such as atomic force (AFM), scanning tunneling (STM), and nearfield optical (NSOM), to sample
Searches related to afm stm
Enter an email to receive alerts for afm-stm "https:" positions