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Website https://sede.udc.gal/services/electronic_board/EXP2026/008881 Requirements Research FieldPhysicsEducation LevelPhD or equivalent Skills/Qualifications PhD Additional Information Eligibility criteria
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studies (QCM-D, AFM), analytics (SEC-MALS/A4F) as well as spectroscopy (NMR/fluorescence/UV/vis) – all supported by quantitative data analysis. The PhD candidate will contribute to bridging research
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aged 1–18). WEBSITE LINK: https://bip.prz.edu.pl/ogloszenia/konkursy/stanowisko-profesora KEYWORDS: Experimental physics, Photovoltaics, Spectroscopic measurement methods DESCRIPTION (scope, expectations
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details, please see: https://hr.utexas.edu/prospective/benefits and https://hr.utexas.edu/current/services/my-total-rewards Must be authorized to work in the United States on an ongoing, full-time basis
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-interferometry, AFM, SEM, Photoelectron and Raman spectroscopy, and Spectroscopic Ellipsometry Develop expertise in cleaning optics, removal of mirror coatings & refurbishments: determine the suitability of
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be characterized by microscopy techniques such as TEM, SEM, and AFM, and spectroscopic methods such as XPS, UPS, EELS, and EDX. Close cooperation with Doctoral Candidate 2 (DC2) will be expected
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, semiconductor materials or optoelectronic devices. Experience with materials characterization techniques such as XRD, XPS, SEM, AFM, ellipsometry, Hall measurements or related methods. Experience with solar-cell
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of internal and external audits. Manage large data center projects and those related to IT infrastructure. Work with AITS Administration and Financial Management (AFM), trades, vendors, and purchasing on data
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across the wafer will be carried out to study how the mechanical properties change with composition. SEM and/or AFM will be used to study the grain size. Heat treatments will be carried out to study
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optical and spectroscopic characterization techniques such as AFM, SEM and TEM as well as XPS to characterize the deposited metallic thin film in depth. Investigating the developed electrodeposition