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-dependent transport measurements, electrochemical methods (cyclic voltammetry, EIS, chronoamperometry), spin-polarized or magnetic-field-modulated electrochemistry, and characterization by AFM, XPS, QCM/QCM-D
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for high-aspect-ratio vertical interconnects characterise the results (SEM, AFM, XCT, optical microscopy) for geometric accuracy, durability and interfacial strength -validate scalability and
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interconnects characterise the results (SEM, AFM, XCT, optical microscopy) for geometric accuracy, durability and interfacial strength -validate scalability and sustainability: less material waste, better energy
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electronic transport directly with structural and nanoscale characterization, including TEM, AFM and nanoARPES. The project combines hands-on device fabrication with advanced measurements and close
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, structural, and vacuum-based characterization, including SEM/EDS, profilometry/AFM, spectroscopy, cathodoluminescence, and EUV emission measurements. Support simulations, data analysis, experimental records
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of AFM images. (1 point) • Basic analysis of GIWAXS diffractograms (linecuts). (1 point) 6. Knowledge of English (Up to 5 points) The level of language proficiency will be evaluated. To receive the maximum
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optical and spectroscopic characterization techniques such as AFM, SEM and TEM as well as XPS to characterize the deposited metallic thin film in depth. Investigating the developed electrodeposition
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, AFM, XRD, eCV, Hall, Nomarski, low- and room-temperature PL). Successful applicants will gain expertise in compound semiconductor epitaxy, advanced characterisation and will combine this with
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competitive funding and has been consistently producing impactful and high-quality research . He is a member of AFMS , InterPore , LAMSES , and an affiliated investigator at Centre for Biomedical Technologies