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techniques and motion correction, or developing novel approaches to signal generation and localisation. You will report to Dr William Clarke and the post holder will be a member of the WIN/FMRIB Physics Group
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with epitaxially grown III-V films using planar device process techniques. You will characterise the performance of these devices using precision optical and electrical measurements including dark IV
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this vacancy or the application process, please contact [email protected] . Click the 'Apply' button below to register an account with our recruitment system (if you have not already) and apply online
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Up to 3 positions are open for Postdoctoral Research Assistants/Associates as part of an ERC awarded project funded by UKIR at the University of Cambridge in the group Catalysis and Process
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date. If you have any questions about this vacancy Prof Tim Coombs [email protected] for technical queries or for the application process, please contact: Sue Murkett, Electrical Engineering Div
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vacancy Prof Tim Coombs [email protected] for technical queries or for the application process, please contact: Sue Murkett, Electrical Engineering Div-administrator email [email protected] (Tel +44 01223
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A position exists for a Post-Graduate Research Assistant (PGRA) or Post-Doctoral Research Associate (PDRA) in the Department of Applied Mathematics and Theoretical Physics to work on verified
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Research Assistant / Research Associate in Frontiers of Atomistic Simulation Techniques (Fixed Term)
. The successful candidate will hold (or be close to obtaining) a PhD in Physics, Theoretical or Computational Chemistry, Materials Modelling (or closely related disciplines), with a proven track record in
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application. For queries relating to the position or the application process, please contact Prof. Robert Phipps on (email: [email protected] ). Please quote reference MA41519 on your application and in any
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and Requirements: PhD in Materials Science, Physics, Electrical Engineering, or a related field (or near completion). Essential: experience with scanning electron microscopy (SEM), experience