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Field
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molecule crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based on powder diffraction, neutron diffraction, or scattering data will also
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reactions in controlled atmosphere with reactive gasses like NH3, H2, N2, and inert Ar. Analytical techniques include the ability to operate and interpret the results from X-ray diffractometer, SQUID and
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). Additional desirable qualifications include experience in the thermal, magnetic, morphological, and structural characterization of materials, particularly by X-ray diffraction (XRD); magnetic and structural
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research seeks to address these challenges through an integrated approach combining high-speed X-ray diffraction (XRD) and other synchrotron-based scattering experiments and advanced data analysis. Central
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Essential Application Experience in cold sintering Desirable Application/interview Experience of standard materials characterisation techniques including X-ray diffraction, scanning electron microscopy, FTIR
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facilities also include more traditional metallurgical instruments including light optical microscopy, scanning electron microscopy with EBSD and ECCI capabilities, TEM, and x-ray diffraction, as
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Application Experience of template-mediated synthesis Desirable Application/interview Practical experience of standard materials characterisation techniques including X-ray diffraction, scanning electron
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including X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), Raman spectroscopy, Fourier-transform infrared spectroscopy (FTIR), mechanical testing
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National Energy Technology Laboratory (NETL) | Pittsburgh, Pennsylvania | United States | about 2 months ago
Fluorescence (XRF), X-ray Diffraction (XRD), X-Ray Photoelectron spectroscopy (XPS) and Scanning Electron Microscopy (SEM). 4. Experience in mentoring graduate students, and a proven track record of publications
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Configure furnaces/reactors and hardware for vacuum systems Perform equipment maintenance and troubleshooting Characterize materials and devices (e.g., microscopy, spectroscopy, X-ray diffraction, electrical