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experience in bio- or chemical catalyst design and materials characterization by standard techniques ( NMR , IR, Mass spectrometry, X-ray diffraction, TEM , and DFT calculations desirable). The Zaleski Lab is
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methods; (2) Production through arc melting, powder metallurgy or additive manufacturing; (3) Characterisation using advanced electron microscopy (SEM, EBSD, TEM), APT and x-ray diffraction methods; (4
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.; chemical and/or physical activation, including reduction, etc.); - material characterization (X-ray diffraction, electron microscopy, chemisorption, thermogravimetric analysis, and other techniques
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, analytical modelling, finite element modelling, design of experiments, material characterization by x-ray diffraction and electron microscopy. Proficiency in other languages of the consortium: Italian
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Institute of Science and Technology Austria (ISTA) | Klosterneuburg, Niederösterreich | Austria | about 2 months ago
‑art scientific services with a new Scientific Service Unit dedicated to experimental chemistry. The Chemistry Support Facility (CSF) offers an array of advanced technologies (X-ray diffraction and spectroscopy, optical spectroscopy) as
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Support Facility (CSF) offers an array of advanced technologies (X-ray diffraction and spectroscopy, optical spectroscopy) as well as an extensive basic equipment infrastructure spanning from
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someone with demonstrable experience in chemical purification and characterization of starting materials and reaction products by standard techniques ( NMR , EPR , IR, Mass spectrometry, X-ray diffraction
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microscopy (SEM), X-ray diffraction (XRD), thermal analysis, and mechanical testing, is preferred, Experience in surface engineering, surface modification, chemical processing, electrochemical
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with experimental work related to gas–solid reactions or high-temperature processing is highly desirable. Hands-on experience with analytical and characterization techniques such as X-ray Diffraction
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chemical characterization using techniques such as powder X-ray diffraction, SEM-EDS and XPS Ionic transport characterization using temperature-dependent impedance spectroscopy Assembly and