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. The postdoctoral fellow must be familiar with the standard characterization techniques used in the group (X-ray diffraction, magnetism, EPR, NMR, UV-Vis-NIR, and infrared/Raman spectroscopy). In order to design
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framework for the joint analysis of large-scale structure (LSS) and gamma-ray data. By combining these complementary probes of the same underlying matter distribution, the project aims to sharpen constraints
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, electron microscopy, X-ray diffraction, etc.). Methodology: • Design and synthesize model substrates to measure the activity of enzyme mimics. • Develop analytical methods to detect and quantify chemical
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Laser Doping or Pulsed Laser Induced Epitaxy, allowing the fabrication of ultra-doped Si:B layers, well above the B solubility limit in Si. The films will be characterized by X-Ray Diffraction
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FieldPhysicsYears of Research Experience1 - 4 Additional Information Eligibility criteria -The candidate should have demonstrated experience in the synthesis, characterization (X-ray diffraction (XRD
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controlled atmosphere - master the usual characterisations of materials (X-ray diffraction, spectroscopies) - have knowledge of magnetism - fluency in English (oral and written comprehension and expression
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. The semiconductors for the photoelectrodes will be supplied by our physicist collaborators, but the preparation and characterizations (X ray diffraction, IR, XPS, BET, TEM, TGA, etc.) of COFs and MOFs will be made by
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data analysis in cosmology and astroparticle physics. These positions focus on the development and application of SBI methods in two contexts: spectroscopic galaxy surveys and the gamma-ray sky
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signatures of axion production in dense media, with a particular emphasis on gamma-ray signatures, gravitational waves, and multi-messenger observables. Qualifications: Applicants should have: a PhD in physics
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LevelPhD or equivalent LanguagesFRENCHLevelBasic Research FieldBiological sciencesYears of Research Experience4 - 10 Additional Information Eligibility criteria The candidate must hold a Ph.D. in the field