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- MOHAMMED VI POLYTECHNIC UNIVERSITY
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Field
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electronics or ultrasound materials, will be an advantage. About the School/Department/Institute/Project The School of Engineering and Materials Science (SEMS) is a large, research-intensive School within
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-OES/ICP-MS, XRD, SEM-EDS, or related methods About the employment The employment is a temporary position of 2 years according to central collective agreement, with possibility of extension for one more
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of polymer characterization techniques (e.g., FTIR, NMR, SEC, TGA, DSC, SEM, XRD, BET, UV–Vis, ICP-OES/MS, or related analytical methods). Experience with ion-exchange polymeric resin synthesis, green
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solid-state NMR • Electron microscopy (SEM, TEM) • Chromatography (HPLC, SEC) • X-ray diffraction • UV-Visible and IR spectroscopy • Light scattering • Material characterization equipment (DSC, TGA, DVS
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, including characterization techniques such as SEM, TEM, FIB, XRD, nano-indentation, etc. Experience with analytical/numerical thermal, thermo-mechanical, plastic deformation, and/or multi-physics modeling
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Jerzy Haber Institute of Catalysis and Surface Chemistry, Polish Academy of Sciences | Poland | 23 days ago
techniques in the characterization of biomaterials and their surfaces, as well as the analysis and interpretation of the obtained results: SEM/TEM, QCM, DLS, FTIR, UV-Vis, NMR, and DSC; and fluorescence
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quality of nanowires. (XRD, SEM, AFM, µ-PL, CL, EBIC etc) You have proven collaborative skills and individual capacity. Assessment criteria This is a career development position primarily focused
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, modification, and physicochemical characterization (XRD, TGA, SEM) of nanoporous materials (zeolites and zeotypes) or other oxydes. - Development of advanced spectroscopic characterization methodologies (IR
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their field of study. Strong experience in various advanced statistical methods (e.g., HLM, SEM, non-linear dynamical systems). Experience working in multidisciplinary teams. Preferred Qualifications: The candidates
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diffraction (XRD), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), transmission electron microscopy (TEM), electrochemical impedance spectroscopy (EIS), and cyclic voltammetry (CV