Sort by
Refine Your Search
-
Category
-
Country
-
Program
-
Employer
- National Aeronautics and Space Administration (NASA)
- CNRS
- Delft University of Technology (TU Delft)
- Eindhoven University of Technology (TU/e)
- European XFEL
- ISCR UMR CNRS 6226 Université de Rennes
- NIST
- Politechnika Rzeszowska (The Rzeszow University of Technology)
- Technical University of Munich
- University of Manchester
- Warsaw University of Technology/Centre for Advanced Materials and Technologies, CEZAMAT
- Łukasiewicz Research Network - Institute of Microelectronics and Photonics
- 2 more »
- « less
-
Field
-
National Aeronautics and Space Administration (NASA) | Pasadena, California | United States | 6 days ago
candidate with strong cleanroom fabrication tool experience, particularly in materials characterization methods such as ellipsometry, AFM, SEM, TEM, XRD, SIMS, or related techniques. Experience with
-
conditions, avoiding any air exposure prior to ions or plasma. A series of surface science and plasma techniques, including X-ray Photoelectron Spectroscopy (XPS), in-situ Spectroscopic Ellipsometry, gas-phase
-
Warsaw University of Technology/Centre for Advanced Materials and Technologies, CEZAMAT | Poland | about 1 month ago
, lithography, plasma deposition, and thermal processes Development and execution of inter-process inspections, including scanning electron microscopy, optical microscopy, atomic force microscopy, ellipsometry
-
equipment (ALD, PECVD, ellipsometry, optical microscopes, SEM, AFM, AFM-IR, Raman spectroscopy, FTIR). Planning and implementing thin-film deposition processes and analysing measurement data. Fulfilling
-
PhD in Optical Characterization and Photonic Performance Analysis of Liquid Crystal Polymer Coatings
; measure angle-dependent reflection, transmission, haze, scattering, polarization selectivity, and spectral bandwidth; perform UV-Vis-NIR spectroscopy, polarized optical microscopy, ellipsometry, Mueller
-
optical properties, using a wide range of experimental techniques (DSC, FTIR, ellipsometry, z-scan, microscopy, Raman spectroscopy). Additional experimental setups will be developed to measure dispersion
-
, ellipsometry or related methods) Ability to troubleshoot complex technical issues and deliver a high‑quality, customer‑focused service Excellent communication, organisational and problem‑solving skills, with
-
-throughput characterization methods include spectroscopy, optical and scanned probe microscopy, scattering, reflectivity, ellipsometry, and contact angle measurements. See http://www.nist.gov/mml/polymers
-
aged 1–18). WEBSITE LINK: https://bip.prz.edu.pl/ogloszenia/konkursy/stanowisko-profesora KEYWORDS: Experimental physics, Photovoltaics, Spectroscopic measurement methods DESCRIPTION (scope, expectations
-
-interferometry, AFM, SEM, Photoelectron and Raman spectroscopy, and Spectroscopic Ellipsometry Develop expertise in cleaning optics, removal of mirror coatings & refurbishments: determine the suitability of