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circumstances such as illness, parental leave, or duties within trade unions, etc., are considered for earlier degrees. The applicant must have abilities to: Use Geographic Information Systems (GIS) to analyze
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layer deposition, and chemical etching. The characterization techniques will include: (i) SEM, TEM, EDS, GI-XRD, Raman scattering, XRF, and GDOES for the deposited materials; (ii) ellipsometry
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abilities: Knowledge of optics, radiative transfer theory. Good visualization skills (using GIS, image processing, graphical software) Prior field work experience. Should hold a valid driver´s license
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