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more complex for CR-PFM than quasi-static PFM. Our project is aimed at establishing CR-PFM as a technique for quantitative imaging of bias-induced strain, and for measuring frequency dependent responses
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laboratory is equipped with both a conventional atom probe tomograph as well as a prototype EUV-modified atom probe tool. Furthmore, our collaborative laboratory structure provides critical in-house support
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NIST only participates in the February and August reviews. The goal of this project is to develop nano-electromagnetic imaging using scanning microwave, NV center, and magnetic resonance microscopy
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