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Broadband Electromagnetic Characterization of Thin-Film Electronic Materials and Devices NIST only participates in the February and August reviews. Electronic material are important for an extremely
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-situ and in-operando investigations of the materials, thin films, and interfaces crucial to energy related systems. NR is a non-perturbing probe of the depth profile of structure in thin-film materials
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also measure nonspecular scattering, from which we can derive in-plane information. Systems of interest include polymer films, magnetic thin films and multilayered structures (using polarized beams
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single crystals to thin films, followed by appropriate electronic and magnetic property characterization. These capabilities are available through collaboration with the University of Maryland. Neutron
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focuses on polymer composites thin films that exhibit enhanced dielectric properties and low water vapor transmission rate. Our goal is to investigate hydration mechanism and the charge transport in thin
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properties, and other surface phenomena. We are particularly interested in the response to temperature, solvents, radiation, pH, ionic strength, biomolecules, and impact on thin polymer film behavior. High
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traditional thin-film devices include exceptional structural quality, high surface-to-volume ratio, bottom-up device engineering with high-density on-chip integration, and utilization of quantum size effects
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, such as network structure, backbone stiffness and side group flexibility, on the rate-dependent elasticity and fracture toughness of extremely tough polymers. key words Mechanical Properties, Thin films
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to the polymers domain. The reasons for this include that in polymers, we often have small datasets (due to costly experiments), sparse datasets (as the goal is often to probe specific quantities rather than a full
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interactions, H-bonding force constants, and anharmonic character of the force fields. Continuous-wave and phase-coherent chirped-pulse methods are used to measure the spectra of bulk (pellet) samples, thin