3 postdoctoral-position-in-nanotechnology positions at NIST

MEMS-Based Scanning Probe Microscopy

microscopy (AFM). STM and AFM have been invaluable tools in the growth of nanotechnology but are limited in measurement speed and scanning area, which has hampered their use as a manufacturing tool and in

Inter-spin Distance Measurements in Nanobiomaterials

Nanotechnology Division opportunity location 50.68.02.B7453 Gaithersburg, MD 20899 NIST only participates in the February and August reviews. Advisers name email phone Veronika Ann Szalai [email protected]

Intrinsic Force Standards Based on Atomic and Molecular Interactions

of piconewton to nanonewton forces, there are a handful of phenomena already referred to as “force standards” in the single-molecule, bioforce literature. We intend to put these phenomena to the test; measuring