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of such processes be experimentally validated under highly controlled conditions with advanced metrology. This project seeks to develop research tools for measuring laser propagation to and from the laser-matter
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nm optical microscopy." Optics Express 21(22): 26219-26226, 2013. http://dx.doi.org/10.1364/Oe.21.026219 Optics; Semiconductors; Ultraviolet; Electromagnetic simulations; Lasers; Nanoscale
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